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Type Hellman, Olof C.; Vandenbroucke, Justin A.; Rusing, Jorg; Isheim, Dieter; Seidman, David N.
  Publication Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram Volume Journal Article
Pages 2000
  Abstract Microscopy & Microanalysis  
  Corporate Author Microsc. Microanal.  
Publisher 6  
Editor 5
  Summary Language 437-444 Series Editor data analysis heterophase interface mgo cu three-dimensional atom-probe segregation gibbsian interfacial excess proxigram ceramic/metal interfaces grain-boundaries scale segregation interfaces solute  
Abbreviated Series Title The three-dimensional (3D) atom-probe technique produces a reconstruction of the elemental chemical identities and three-dimensional positions of atoms field evaporated from a sharply pointed metal specimen, with a local radius of curvature of less than 50 nm. The number of atoms collected can be on the order of one million, representing an analysis volume of approximately 20 nm 20 nm 200 nm (80,000 nm3). This large amount of data allows for the identification of microstructural features in a sample, such as grain or heterophase boundaries, if the feature density is large enough. Correlation of the measured atomic positions with these identified features results in an atom-by-atom description of the chemical environment of crystal- lographic defects. This article outlines a data compilation technique for the generation of composition profiles in the vicinity of interfaces in a geometrically independent way. This approach is applied to quantitative determination of interfacial segregation of silver at a MgO/Cu(Ag) heterophase interface.
  Series Issue Hellman, O. C. Northwestern Univ, Dept Mat Sci & Engn, 2225 N Campus Dr, Evanston, IL 60208 USA Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA ISSN  
Medium
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no NU @ karnesky @ 661
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